Admittance spectroscopy

Admittance spectroscopy is a deep level characterization technique.

It measures both conductance and capacitance as a function of temperature (thermal) and frequency of modulating voltage, and as a function of illumination by light (optical).

Admittance spectroscopy complements deep level transient spectroscopy (DLTS) and is used to detect both shallow dopants and deep defect centers.

Optical admittance spectroscopy is suitable for probing deeper defects without resorting to high temperatures.






















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